The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

Jan. 31, 2008
Applicants:

Ziquan Bai, Beijing, CN;

Hongwei Kong, Beijing, CN;

Ya Jing, Beijing, CN;

Inventors:

Ziquan Bai, Beijing, CN;

Hongwei Kong, Beijing, CN;

Ya Jing, Beijing, CN;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for determining in-phase and quadrature-phase mismatch in a multiple-input, multiple-output (MIMO) communication architecture includes at least one transmitter coupled to at least one receiver and an in-phase (I) signal, quadrature-phase (Q) signal mismatch element configured to receive and Q signal components over at least one communication channel, the I/Q signal mismatch element also configured to provide a signal representing gain imbalance, a signal representing quadrature error and a signal representing I/Q offset.


Find Patent Forward Citations

Bai, Ziquan. (2012). System and method for in-phase/quadrature-phase (i/q) mismatch measurement and compensation (U.S. Patent No. 8126086). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8126086

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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