The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

Jun. 16, 2006
Applicants:

Paul S. Nizin, Sugar Land, TX (US);

Feng MA, Houston, TX (US);

Ramiro Pino, Pearland, TX (US);

Inventors:

Paul S. Nizin, Sugar Land, TX (US);

Feng Ma, Houston, TX (US);

Ramiro Pino, Pearland, TX (US);

Assignee:

Best Medical International, Inc., Springfield, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system to provide enhanced computational efficiency in a simulation of particle transport through a medium, program product, and related methods are provided. The system can include a simulation data administrator server having access to an interaction database including records related to parameters describing interactions of particles in an absorbing medium to provide particle interaction parameters, and a simulated dose calculation computer in communication with the simulation data administrator server through a communications network. The system can also included simulated dose calculation program product stored in memory of the simulated dose calculation computer and including instructions that when executed by a processor causes the processor to perform for each of a plurality of particles deliverable from a particle source the operations of providing parameters for a medium to perform a Monte Carlo simulation to develop a map of simulated absorbed dose in the medium, and artificially adjusting simulation particle fluxes to achieve a substantially constant variance throughout a depth of the medium.


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