The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

Mar. 05, 2010
Applicants:

Mark A. Nichols, San Jose, CA (US);

Harold H. Gee, San Jose, CA (US);

Eric Roddick, San Jose, CA (US);

Mrugesh Desai, San Jose, CA (US);

Inventors:

Mark A. Nichols, San Jose, CA (US);

Harold H. Gee, San Jose, CA (US);

Eric Roddick, San Jose, CA (US);

Mrugesh Desai, San Jose, CA (US);

Assignee:

WD Media, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01); G11B 5/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

Cross-track density capability is predicted for a large number of writes based on a plurality of erase band width measurements. Over the plurality of erase band width measurements, a number of writes in a series of writes performed as part of an aggressing track sequence is varied. A model of the magnetic track width (MTW) as function of the number of writes employed in the MTW measurements may be generated and an estimate of the erase band width for a large number of writes derived from the model as a prediction of cross-track density capability.


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