The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2012
Filed:
Jul. 30, 2009
Sergei Nikitin, Springfield, VA (US);
Charles K Manka, Alexandria, VA (US);
Sergei Nikitin, Springfield, VA (US);
Charles K Manka, Alexandria, VA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
An additive {hacek over (S)}olc filter (ASF) includes i) a first polarizer for receiving an input light, such as from a monochromatic light source, and transmitting a first polarized output, ii) at least one birefringent plate positioned to receive the first polarizer output and transmit an output with wavelength-dependent polarization state, and iii) a second polarizer for receiving the plate output and transmitting a second polarized, filtered output. An ASF spectroscopy system includes the ASF; a monochromatic light source input, e.g. a laser; a sample chamber for exposing a sample to the second polarized, tuned output and generating a signal characteristic of the sample that is filtered by the ASF; and a detector for acquiring the characteristic signal.