The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

Apr. 28, 2008
Applicants:

Ed Dottery, Palm Harbor, FL (US);

Rob Waterbury, Palm Harbor, FL (US);

Chris Stefano, Dunedin, FL (US);

Roy Walters, Enterprise, FL (US);

Jeremy Rose, Largo, FL (US);

Frank Vilardi, Largo, FL (US);

Inventors:

Ed Dottery, Palm Harbor, FL (US);

Rob Waterbury, Palm Harbor, FL (US);

Chris Stefano, Dunedin, FL (US);

Roy Walters, Enterprise, FL (US);

Jeremy Rose, Largo, FL (US);

Frank Vilardi, Largo, FL (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A spectroscopy system including first and second lasers. The first laser is triggered to induce a plasma, such as on a surface of a target at a stand-off distance from the target. The second laser stimulates amplified emissions from the plasma detected by one or more spectroscopes. The gain induced by the second laser detects traces of explosives and other substances on surfaces at stand-off distances. The spectroscopy systems use the same telescopic optics to collect emissions from the detection surface and activated at or just before the peak emission intensity useful for detecting element signatures and intensity ratios from the trace elements in the plasma.


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