The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

Mar. 26, 2009
Applicants:

Kiyokazu Ieda, Kariya, JP;

Yuichi Murakami, Chiryu, JP;

Hiroki Okada, Toyota, JP;

Inventors:

Kiyokazu Ieda, Kariya, JP;

Yuichi Murakami, Chiryu, JP;

Hiroki Okada, Toyota, JP;

Assignee:

Aisin Seiki Kabushiki Kaisha, Kariya-Shi, Aichi-Ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 13/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An abnormality detecting apparatus includes a power supply portion applying a voltage to electrodes provided at both surfaces of a light control glass adapted to be provided at a vehicle to change a transparency of the light control glass, a detection portion detecting a detectable amount obtained on the basis of the voltage applied to the electrodes, and an abnormality determination portion determining whether or not an abnormality occurs to the light control glass based on a predetermined detectable amount and the detectable amount detected by the detection portion.


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