The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2012
Filed:
Jan. 03, 2008
Xingdong Dai, Bethlehem, PA (US);
Weiwei Mao, Macungie, PA (US);
Max J. Olsen, Mertztown, PA (US);
Geoffrey Zhang, Allentown, PA (US);
Xingdong Dai, Bethlehem, PA (US);
Weiwei Mao, Macungie, PA (US);
Max J. Olsen, Mertztown, PA (US);
Geoffrey Zhang, Allentown, PA (US);
Agere Systems Inc., Allentown, PA (US);
Abstract
A method and system for modeling and calibrating duty cycle distortion (DCD) of a Serializer and Deserializer (SerDes) device, including first generating a clock DCD signal. Once the clock DCD signal is generated, it is calibrating based upon results obtained from a filtering process of the clock DCD signal. Once the clock DCD signal is calibrated, a data DCD signal is generated and calibrated based upon results obtained from a filtering process of the data DCD signal.