The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

May. 18, 2009
Applicants:

Matthias Jungbluth, Berlin, DE;

Rolf Wilkenhöner, Kleinmachnow, DE;

Inventors:

Matthias Jungbluth, Berlin, DE;

Rolf Wilkenhöner, Kleinmachnow, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining and evaluating eddy-current displays, in particular cracks, in a test object made from an electrically conductive material is provided. The method uses the following steps, applying an alternating electromagnetic field of a predetermined constant or variable frequency to the test object, detecting the eddy currents induced in the test object along predetermined parallel measuring tracks, providing eddy-current signals each eddy-current signal is assigned to a measuring track, conditioning the eddy-current signals and providing conditioned measured variables, interpreting the conditioned measured variables using a predetermined evaluation algorithm, and providing synthetic crack signals.


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