The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

Jan. 15, 2009
Applicants:

Todd E. Sessler, Goleta, CA (US);

Matthew T. Kuiken, Goleta, CA (US);

Robert M. Stokes, The Colony, TX (US);

William M. Bowser, Plano, TX (US);

Inventors:

Todd E. Sessler, Goleta, CA (US);

Matthew T. Kuiken, Goleta, CA (US);

Robert M. Stokes, The Colony, TX (US);

William M. Bowser, Plano, TX (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes determining a signal current based on an average current associated with one or more detectors. The method also includes determining a strip voltage based on the signal current. The method further includes biasing a strip resistance with the strip voltage. The biasing of the strip resistance creates a strip current. The method additionally includes biasing a detector array with a detector voltage. The biasing of the detector array creates a detector current. The method also includes determining levels of incident radiation from a scene based on the strip current and the detector current.


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