The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2012

Filed:

Mar. 23, 2005
Applicants:

Anna Lee Tonkovich, Marysville, OH (US);

Barry L. Yang, Dublin, OH (US);

Terry Mazanec, Solon, OH (US);

Francis P. Daly, Delaware, OH (US);

Sean P. Fitzgerald, Columbus, OH (US);

Ravi Arora, Dublin, OH (US);

Dongming Qiu, Bothell, WA (US);

Bin Yang, Columbus, OH (US);

Steven T. Perry, Galloway, OH (US);

Kai Jarosh, Bexley, OH (US);

Paul W. Neagle, Westerville, OH (US);

David J. Hesse, Columbus, OH (US);

Rachid Taha, Dublin, OH (US);

Richard Long, New Albany, OH (US);

Jeff Marco, South Charleston, OH (US);

Thomas D. Yuschak, Lewis Center, OH (US);

Jeffrey J. Ramler, Lewis Center, OH (US);

Mike Marchiando, London, OH (US);

Inventors:

Anna Lee Tonkovich, Marysville, OH (US);

Barry L. Yang, Dublin, OH (US);

Terry Mazanec, Solon, OH (US);

Francis P. Daly, Delaware, OH (US);

Sean P. Fitzgerald, Columbus, OH (US);

Ravi Arora, Dublin, OH (US);

Dongming Qiu, Bothell, WA (US);

Bin Yang, Columbus, OH (US);

Steven T. Perry, Galloway, OH (US);

Kai Jarosh, Bexley, OH (US);

Paul W. Neagle, Westerville, OH (US);

David J. Hesse, Columbus, OH (US);

Rachid Taha, Dublin, OH (US);

Richard Long, New Albany, OH (US);

Jeff Marco, South Charleston, OH (US);

Thomas D. Yuschak, Lewis Center, OH (US);

Jeffrey J. Ramler, Lewis Center, OH (US);

Mike Marchiando, London, OH (US);

Assignee:

Velocys, Plain City, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B05D 7/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

Interior microchannels within microchannel apparatus are uniformly coated. Remarkably, these uniform coatings are formed from materials that are applied to the interior microchannels after an apparatus has been assembled or manufactured. Coatings can be made uniform along the length of a microchannel, in the corner of a microchannel, and/or throughout numerous microchannels in an array of microchannels. Techniques for tailoring the application of washcoats onto microchannels is also described.


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