The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Jun. 28, 2006
William Dale Andruss, Minneapolis, MN (US);
Christopher Hercules Claudatos, San Jose, CA (US);
Bruce David Leetch, Mason, OH (US);
Steven R. Terwilliger, Foster City, CA (US);
William Dale Andruss, Minneapolis, MN (US);
Christopher Hercules Claudatos, San Jose, CA (US);
Bruce David Leetch, Mason, OH (US);
Steven R. Terwilliger, Foster City, CA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
Scanning is disclosed. A scan collection period is determined. A system is monitored to detect object events during the scan collection period, and differential and incremental scan lists may be updated with information regarding objects to be scanned, based on some of the object events. Objects are scanned based on the information in the incremental scan list. Objects are scanned based on the information in the differential scan list. The incremental scan may be performed more than once before the differential scan is performed. Information regarding objects associated with object events occurring outside the scan collection period may be removed from the scan list.