The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2012

Filed:

Jun. 18, 2008
Applicants:

Hong Cheng, Urbana, IL (US);

Wei Fan, New York, NY (US);

Xifeng Yan, Montrose, NY (US);

Philip Shi-lung Yu, Chicago, IL (US);

Inventors:

Hong Cheng, Urbana, IL (US);

Wei Fan, New York, NY (US);

Xifeng Yan, Montrose, NY (US);

Philip Shi-lung Yu, Chicago, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for classifying structural data with skewed distribution are disclosed. By way of example, a method classifying structural input data comprises a computer system performing the following steps. Multiple classifiers are constructed, wherein each classifier is constructed on a subset of training data, using one or more selected composite features from the subset of training data. A consensus among the multiple classifiers is computed in accordance with a voting scheme such that at least a portion of the structural input data is assigned to a particular class in accordance with the computed consensus. Such techniques for structured data classification are capable of handling skewed class distribution and partial feature coverage issues.


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