The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Oct. 25, 2007
Applicants:
Young Bae Hwang, Daejeon, KR;
Jun Sik Kim, Seoul, KR;
IN SO Kweon, Daejeon, KR;
Inventors:
Assignee:
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides a method and apparatus for detecting a noise distribution of an image close to a true distribution, and detecting an edge of the image precisely and quickly based on the detected noise distribution without performing a smoothing process for the image, and a computer readable medium processing the method. The method of detecting an edge of an image includes the steps of: detecting a noise distribution of an object image; and detecting an edge of the image based on the detected noise distribution.