The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2012

Filed:

Dec. 15, 2006
Applicants:

Toshihiro Hayashi, Tokyo, JP;

Yukihiro Kawano, Tokyo, JP;

Hideo Terada, Tokyo, JP;

Inventors:

Toshihiro Hayashi, Tokyo, JP;

Yukihiro Kawano, Tokyo, JP;

Hideo Terada, Tokyo, JP;

Assignee:

IHI Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention includes a step Sfor inputting into a computer coordinate values on a three-dimensional shape; a step Sfor structuring an environment model that partitions a spatial region, in which a three-dimensional shape exists, into a plurality of voxels of rectangular solids, and stores each position; and a step Sfor setting and recording a representative point and an error distribution thereof, within the voxel corresponding to the coordinate value. If there is no data in a previous measurement position, position matching is performed in a fine position matching step Sso as to minimize an evaluation value regarding the distances between adjacent error distributions by rotating and translating a new measurement data and error distribution for the environment model for a previous measuring position, or rotating and translating an environment model for a new measuring position, relative to an environment model for a previous measuring position.


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