The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Oct. 23, 2006
Hitoshi Imaoka, Tokyo, JP;
Hitoshi Imaoka, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
[PROBLEMS] To provide a feature extracting method for quickly extracting a feature while preventing lowering of the identification performance of the kernel judgment analysis, a feature extracting system, and a feature extracting program. [MEANS FOR SOLVING PROBLEMS] Judgment feature extracting device () computes an interclass covariance matrix SB and an intraclass covariance matrix SW about a learning face image prepared in advance, determines optimum vectors η, γ which maximizes the ratio of the interclass covariance to the intraclass covariance, derives a conversion formula for converting an inputted frequency feature vector x into a frequency feature vector y in a judgment space, and extracts judgment features of a face image for record and a face image for check by using a restructured conversion formula. Similarity computing device () computes the similarity by comparing the judgment features. Check judging device judges whether or not the persons are the same by comparing the similarity with a threshold.