The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Feb. 23, 2007
Todd Jochem, Wexford, PA (US);
Parag Batavia, Wexford, PA (US);
Mark Ollis, Cranberry Township, PA (US);
Todd Jochem, Wexford, PA (US);
Parag Batavia, Wexford, PA (US);
Mark Ollis, Cranberry Township, PA (US);
Applied Perception, Inc., Wexford, PA (US);
Abstract
A system and method of identifying a position of a crop row in a field, where an image of two or more crop rows is transmitted to a vision data processor. The vision data processor defines a candidate scan line profile for a corresponding heading and pitch associated with a directional movement of a vehicle, for example, traversing the two or more crop rows. The candidate scan line profile comprises an array of vector quantities, where each vector quantity comprises an intensity value and a corresponding position datum. A preferential scan line profile in a search space about the candidate scan line profile is determined, and the candidate scan line profile is identified as a preferential scan line profile for estimating a position (e.g., peak variation) of one or more crop rows if a variation in the intensity level of the candidate scan line profile exceeds a threshold variation value. In addition, a template scan line profile may be utilized, where a candidate scan line profile is identified to be a preferential scan line profile if it is consistent with the template scan line profile.