The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Jan. 29, 2009
Applicants:
Wan Seob Lee, Gangwon-Do, KR;
Jin Yong Seong, Seoul, KR;
Inventors:
Wan Seob Lee, Gangwon-Do, KR;
Jin Yong Seong, Seoul, KR;
Assignee:
Hynix Semiconductor Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test method for nonvolatile memory devices where, in one aspect of the method, a specific operation mode is selected according to a signal input through a single I/O pin in a period in which a write enable signal is inactivated. The write enable signal or a read enable signal is activated according to the selected operation mode. A plurality of signals is input through the single I/O pin in a period in which the write enable signal is activated. The plurality of signals is output through the single I/O pin in a period in which the read enable signal is activated.