The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8120867 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 21, 2012

Filed:

May. 15, 2008
Applicants:

Keith Rowland Charles Brady, Hampshire, GB;

Gregory Martin Quick, Hampshire, GB;

Paul Harvey Ronald Jolly, Hampshire, GB;

Inventors:

Keith Rowland Charles Brady, Hampshire, GB;

Gregory Martin Quick, Hampshire, GB;

Paul Harvey Ronald Jolly, Hampshire, GB;

Assignees:

Xyratex Technology Limited, Havant, GB;

Seagate Technology LLC, Scotts Valley, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01); G11B 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of generating a test pattern of data to be written to a data storage disk medium for testing includes: rotating the disk; detecting fluctuations in the speed of rotation of the disk; producing a reference clock signal in accordance with the fluctuations so as to be synchronized with the rotation of the disk; and, generating a test pattern of data using the reference clock signal as a timing reference. An apparatus for generating a test pattern of data includes a spindle for rotating a disk; a detector arranged to detect fluctuations in the speed of rotation of the disk; a processor arranged to produce a reference clock signal in accordance with fluctuations so as to be synchronized with the rotation of the disk; and, a pattern generator arranged to generate a test pattern of data using the reference clock signal as a timing reference.


Find Patent Forward Citations

Brady, Keith Rowland Charles. (2012). Apparatus and methods of generating a test pattern of data, analysing a test pattern of data, and testing a data storage disk medium and/or a read/write head (U.S. Patent No. 8120867). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8120867

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