The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2012

Filed:

Feb. 25, 2009
Applicants:

Kazuhiko Hirokawa, Kanagawa, JP;

Makoto Furuki, Kanagawa, JP;

Kazunori Anazawa, Kanagawa, JP;

Tomoko Miyahara, Kanagawa, JP;

Minquan Tian, Kanagawa, JP;

Shinji Hasegawa, Kanagawa, JP;

Takashi Matsubara, Kanagawa, JP;

Yuka Ito, Kanagawa, JP;

Miho Watanabe, Kanagawa, JP;

Inventors:

Kazuhiko Hirokawa, Kanagawa, JP;

Makoto Furuki, Kanagawa, JP;

Kazunori Anazawa, Kanagawa, JP;

Tomoko Miyahara, Kanagawa, JP;

Minquan Tian, Kanagawa, JP;

Shinji Hasegawa, Kanagawa, JP;

Takashi Matsubara, Kanagawa, JP;

Yuka Ito, Kanagawa, JP;

Miho Watanabe, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing device provided with an acquiring unit and a generating unit. The acquiring unit acquires invisible image data of an invisible image subject to forming on a recording medium with invisible coloring material and acquires source image data of a source image subject to forming on the recording medium with visible coloring material. The generating unit generates corrected-image-data of the source image data corrected according to the absorption wavelength characteristics of the invisible coloring material, such that the color of overlapping regions where both the invisible image and the source image are superimposed when formed on the recording medium approximates to the color of regions corresponding to the overlapping regions in the source image.


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