The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Jul. 20, 2010
Applicants:
Iman Hung, Tao Yuan Shien, TW;
Yu-chi Chung, Tao Yuan Shien, TW;
Hsin-hung Lee, Tao Yuan Shien, TW;
Inventors:
Assignee:
Quanta Computer, Inc., , TW;
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention provides a system and method for inspecting a three-dimensional sensor. According to the invention, a light source is controlled to emit a light of a known phase, and the known phase of the emitted light is altered by at least two known phase values. The three-dimensional sensor is driven in sensing the light reflected by the inspecting space to capture an image. In accordance with the captured image and the relative angle and the active brightness of each pixel thereof and the plurality of reference data, at least two quality data relative to the three-dimensional sensor are calculated.