The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Dec. 09, 2008
Applicants:
Scot R. Weinberger, Montara, CA (US);
Bruce J. Richardson, Santa Cruz, CA (US);
Darryl J. Bornhop, Nashville, TN (US);
Inventors:
Scot R. Weinberger, Montara, CA (US);
Bruce J. Richardson, Santa Cruz, CA (US);
Darryl J. Bornhop, Nashville, TN (US);
Assignees:
Molecular Sensing, Inc., Montara, CA (US);
Vanderbilt University, Nashville, TN (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
This invention provides an interferometric detection device configured to maintain a temperature of a sensing area to within 20 m° C. of a first target temperature and to maintain a temperature of the medium within 500 m° C. of a second target temperature The device can do so under conditions in which ambient temperature changes from 0.1° C. to 5° C. over 5 minutes.