The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Sep. 30, 2008
Stephan Wagner-conrad, Jena, DE;
Frank Hecht, Weimar, DE;
Klaus Weisshart, Jena, DE;
Ralf Netz, Jena, DE;
Stephan Wagner-Conrad, Jena, DE;
Frank Hecht, Weimar, DE;
Klaus Weisshart, Jena, DE;
Ralf Netz, Jena, DE;
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a raster image correlation spectroscopy measurement (RICS) measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. For a raster image correlation spectroscopy measurement, a best value for a sampling value is determined and is specified for a subsequent scanning process on a sample. In order to carry out or evaluate a RICS measurement, sampling values are acquired or a correlation is determined exclusively in a sample region within which a pixel time (ΔP) changes along a harmonically controlled scan axis (X) by less than, or at most by, a predetermined or predeterminable value.