The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Jul. 10, 2007
Mohammad K. Islam, Oakville, CA;
Bernhard D. Norrlinger, Mississauga, CA;
Duncan M. Galbraith, Burlington, CA;
David A. Jaffray, Etobicoke, CA;
Robert K. Heaton, Toronto, CA;
Jason Smale, Toronto, CA;
Mohammad K. Islam, Oakville, CA;
Bernhard D. Norrlinger, Mississauga, CA;
Duncan M. Galbraith, Burlington, CA;
David A. Jaffray, Etobicoke, CA;
Robert K. Heaton, Toronto, CA;
Jason Smale, Toronto, CA;
University Health Network, Toronto, CA;
Abstract
Various embodiments are described herein for an area integrated fluence monitoring sensor that can be used to measure a radiation dose. The sensor comprises at least one Gradient Ion Chamber (GIC) comprising an ion chamber having a volume gradient across a length or width thereof, a gas or liquid located within the ion chamber and an electrode to detect ions generated within the gas or liquid when the at least one GIC is subjected to an ionizing radiation beam. Various embodiments are also described herein for an Integral Quality Monitoring system and associated method that can be used to measure and monitor the quality of radiation doses provided by a radiation treatment system.