The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Mar. 28, 2007
Yousuke Tanaka, Kobe, JP;
Masayuki Ikeda, Kobe, JP;
Takamichi Naito, Kobe, JP;
Sysmex Corporation, Kobe, JP;
Abstract
A specimen analysis method, comprising: bringing a first specimen vessel to a sucking position for sucking specimens; obtaining a first measurement result of a first specimen contained in the first specimen vessel; bringing a second specimen vessel to the sucking position before the first measurement result is obtained; obtaining a second measurement result of a second specimen contained in the second specimen vessel; bringing a third specimen vessel to the sucking position after the first measurement result is obtained; obtaining a third measurement result of a third specimen contained in the third specimen vessel; and obtaining a fourth measurement result of the second specimen when the first measurement result is higher than a threshold, the second specimen being sucked at the sucking position again for obtaining the fourth measurement result before bringing the third specimen vessel to the sucking position, is disclosed. A specimen analysis is also disclosed.