The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Oct. 07, 2010
Wolfgang Petrich, Bad Schonborn, DE;
Wilfried Schmid, Mannheim, DE;
Gerrit Kocherscheidt, Heddesheim, DE;
Jean-michel Asfour, Weinheim, DE;
Wolfgang Petrich, Bad Schonborn, DE;
Wilfried Schmid, Mannheim, DE;
Gerrit Kocherscheidt, Heddesheim, DE;
Jean-Michel Asfour, Weinheim, DE;
Roche Diagnostics GmbH, Mannheim, DE;
Abstract
A test element analysis system for the analytical investigation of a liquid sample, comprising a test element including a carrier film having at least one flat side and a test field secured to the flat side and an evaluation instrument including a test element holder for positioning a test element in a measuring position, a measuring device for measuring the optically measurable change in the detection zone, and a housing within the measuring device is positioned. The test element is positioned in the measuring position in such a manner that a first partial section of the test element is located inside the housing and a second partial section is located outside of the housing to be easily accessible.