The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Feb. 08, 2008
Applicants:
Mark L. Palmeri, Durham, NC (US);
Kathryn R. Nightingale, Durham, NC (US);
Gregg E. Trahey, Durham, NC (US);
Kristin D. Frinkley, Durham, NC (US);
Inventors:
Mark L. Palmeri, Durham, NC (US);
Kathryn R. Nightingale, Durham, NC (US);
Gregg E. Trahey, Durham, NC (US);
Kristin D. Frinkley, Durham, NC (US);
Assignee:
Duke University, Durham, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods for determining a mechanical parameter of a sample include detecting shear waves that have been generated in the sample by an applied shear wave source. A time of peak displacement of the shear waves for a plurality of sample positions is determined. At least one mechanical parameter of the sample based on the time of peak displacement for the plurality of sample positions is determined.