The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2012

Filed:

Sep. 01, 2010
Applicants:

Craig Elwyn Murray, Davenport, IA (US);

Dale R. Tanis, Geneseo, IL (US);

James W. Minnihan, Moline, IL (US);

Inventors:

Craig Elwyn Murray, Davenport, IA (US);

Dale R. Tanis, Geneseo, IL (US);

James W. Minnihan, Moline, IL (US);

Assignee:

CNH America LLC, New Holland, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01D 75/18 (2006.01); A01F 12/16 (2006.01); A01F 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for use with the combine comprises a plurality of sensors to detect the uniformity of crop material being conveyed running threshing portion of the combine to including system into combine. Methods and systems are provided that utilize this plurality of sensors to provide substantially automatic control of combine parameters that mitigate the non-uniformity of a grain bed in the cleaning system. The system may also inform an operator of a suggested manual adjustments to mitigate the non-uniformity.


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