The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2012

Filed:

Mar. 11, 2008
Applicants:

Chidanand Apte, Chappaqua, NY (US);

Jin Dong, Beijing, CN;

Ta-hsin LI, Danbury, CT (US);

Ming Xie, Beijing, CN;

Wen Jun Yin, Beijing, CN;

Bin Zhang, Beijing, CN;

Ming H. Zhu, Beijing, CN;

Inventors:

Chidanand Apte, Chappaqua, NY (US);

Jin Dong, Beijing, CN;

Ta-Hsin Li, Danbury, CT (US);

Ming Xie, Beijing, CN;

Wen Jun Yin, Beijing, CN;

Bin Zhang, Beijing, CN;

Ming H. Zhu, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method, apparatus and system for location evaluation and site selection, capable of effectively configuring the site network and evaluating the facility location by scientifically modeling and incorporating human knowledge are provided. In one aspect, geographic and demographic data associated with a plurality of locations and human knowledge comprising partial rating knowledge and pair-wise preference knowledge are used in a regression algorithm to construct a location evaluation model. The regression algorithm is further refined using active learning that identifies a plurality of pairs of locations to improve precision of the regression algorithm.


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