The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2012

Filed:

Sep. 12, 2008
Applicants:

Anbessie A. Yitbarek, Renton, WA (US);

I-li LU, Issaquah, WA (US);

Ranjan K. Paul, Sammamish, WA (US);

Farshad Dopulatshahi, Mercer Island, WA (US);

Elizabeth A. Whalen, Seattle, WA (US);

Shuying Zhu, Seattle, WA (US);

Peter A. Fiddler, Seattle, WA (US);

Inventors:

Anbessie A. Yitbarek, Renton, WA (US);

I-Li Lu, Issaquah, WA (US);

Ranjan K. Paul, Sammamish, WA (US);

Farshad Dopulatshahi, Mercer Island, WA (US);

Elizabeth A. Whalen, Seattle, WA (US);

Shuying Zhu, Seattle, WA (US);

Peter A. Fiddler, Seattle, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G04F 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer implemented method, apparatus, and computer program product for identifying an interval for performing a maintenance task. The process retrieves scheduled maintenance data and un-scheduled in-service maintenance data for a given apparatus type. The process maps the un-scheduled in-service maintenance data to the scheduled maintenance data for the given apparatus type to form mapped maintenance data. The process performs a statistical analysis on the mapped maintenance data. The process identifies an optimal interval for performing the maintenance task based on a result of the statistical analysis to form a recommended maintenance interval.


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