The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2012

Filed:

Jun. 04, 2008
Applicant:

Toshio Kamei, Tokyo, JP;

Inventor:

Toshio Kamei, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

An input pattern feature amount is decomposed into element vectors. For each of the feature vectors, a discriminant matrix obtained by discriminant analysis is prepared in advance. Each of the feature vectors is projected into a discriminant space defined by the discriminant matrix and the dimensions are compressed. According to the feature vector obtained, projection is performed again by the discriminant matrix to calculate the feature vector, thereby suppressing reduction of the feature amount effective for the discrimination and performing effective feature extraction.


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