The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2012
Filed:
Aug. 28, 2007
Michael Joseph Kirby, Fort Collins, CO (US);
James Ross Beveridge, Fort Collins, CO (US);
Jen-mei Chang, Fort Collins, CO (US);
Bruce Anthony Draper, Fort Collins, CO (US);
Holger Philipp Kley, Fort Collins, CO (US);
Christopher Scott Peterson, Fort Collins, CO (US);
Michael Joseph Kirby, Fort Collins, CO (US);
James Ross Beveridge, Fort Collins, CO (US);
Jen-Mei Chang, Fort Collins, CO (US);
Bruce Anthony Draper, Fort Collins, CO (US);
Holger Philipp Kley, Fort Collins, CO (US);
Christopher Scott Peterson, Fort Collins, CO (US);
Colorado State University Research Foundation, Fort Collins, CO (US);
Abstract
A pattern recognition system compares a set of unlabeled images (or other patterns) having a variation of state in a set-by-set comparison with individual data sets of multiple labeled images (or other patterns) also having a variation of state. The individual data sets are each mapped to a point on a parameter space (e.g., a Grassmannian manifold, a Stiefel manifold, a flag manifold, etc.), and the set of unlabeled images is mapped to a point in the same parameter space. If the point associated with the set of unlabeled images satisfies a distance criterion on the parameter space with regard to one of the points on the parameter space, the data set of unlabeled images is assigned to the class attributed to that point.