The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2012

Filed:

Dec. 15, 2006
Applicants:

Toshihiro Hayashi, Tokyo, JP;

Yukihiro Kawano, Tokyo, JP;

Hideo Terada, Tokyo, JP;

Inventors:

Toshihiro Hayashi, Tokyo, JP;

Yukihiro Kawano, Tokyo, JP;

Hideo Terada, Tokyo, JP;

Assignee:

IHI Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A three-dimensional shape data position matching method for measuring a static three-dimensional shape from a plurality of measuring positions, and for combining and position matching the distance data thereof, including: a data inputting step Sfor inputting, into a computer, coordinate values on a three-dimensional shape at a new measuring position; a model structuring step Sfor structuring an environment model that partitions a spatial region in which the three-dimensional shape exists, into a plurality of voxels formed from rectangular solids, of which the boundary surfaces are mutually perpendicular, and stores the positions of the individual voxels; a matching step Sfor setting and recording a representative point and an error distribution thereof, within the voxel corresponding to the coordinate value; a fine matching step Sfor position matching so as to minimize the summation of the distances between adjacent error distributions by rotating and translating a new measured data and error distribution, or rotating and translating an environment model for a new measuring position, relative to an environment model for a previous measuring position; and an outputting step for outputting, to an outputting device, the voxel position, the representative point, and the error distribution.


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