The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2012
Filed:
Jul. 13, 2009
Cynthia B. Perz, Huntington Beach, CA (US);
Robert T. Ellis, Dana Point, CA (US);
Jose DE LA Torre-bueno, Carlsbad, CA (US);
Cynthia B. Perz, Huntington Beach, CA (US);
Robert T. Ellis, Dana Point, CA (US);
Jose De La Torre-Bueno, Carlsbad, CA (US);
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
The present disclosure includes systems and techniques relating to intelligently directed segmentation analysis for automated microscope systems. In general, in one implementation, the technique includes obtaining an image of at least a portion of a scan region including a biological specimen, partitioning the obtained image into zelles, determining one or more parameters of the zelles, performing a cluster analysis on the one or more parameters of the zelles, differentiating tissue of greater interest from tissue of lesser interest in the obtained image based on the cluster analysis and based on a test being performed for the biological specimen, and storing more information for the tissue of greater interest than information for the tissue of lesser interest. The cluster analysis can be a multivariate statistical cluster analysis, and the zelles can be test-dependent zelles (e.g., having dimensions defined according to the test being performed for the biological specimen).