The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2012

Filed:

Nov. 11, 2008
Applicants:

Ilmar Hein, Chicago, IL (US);

Aleksandr Zamyatin, Buffalo Grove, IL (US);

Inventors:

Ilmar Hein, Chicago, IL (US);

Aleksandr Zamyatin, Buffalo Grove, IL (US);

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of computed-tomography and a computed-tomography apparatus where a interpolation kernel width is adaptively determined as a function of the distance from the x-ray source to the reconstruction pixel. The width of the kernel is the projection of the reconstruction pixel on the detector. The method can be implemented in the channel direction. The method can also be implemented in the segment direction, or in the channel and segment directions at the same time. Backprojection is performed using the adaptive kernel width and may by used with helical and circular scanning, and with cone-beam or fan beam x-ray CT.


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