The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2012
Filed:
Nov. 03, 2010
Kyung-jin Kim, Uiwang-si, KR;
Jae-hyuk Yu, Suwon-si, KR;
Kyung-jin Kim, Uiwang-si, KR;
Jae-hyuk Yu, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Abstract
A method of detecting defects of a recording medium comprises detecting a number of error-corrected error correction code symbols in each of a plurality of sectors in the recording medium, classifying sectors having a number of error-corrected ECC symbols greater than a first threshold value as first type defect sectors, calculating moving averages of the numbers of error-corrected ECC symbols in units of a predetermined number of sectors, and classifying sectors that are used to calculate a moving average greater than a second threshold value as second type defect sectors.