The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2012

Filed:

Oct. 05, 2009
Applicants:

Rico Priesnitz, Blies-Ebersing, FR;

Judith Stauder, Blies-Ebersing, FR;

Inventors:

Rico Priesnitz, Blies-Ebersing, FR;

Judith Stauder, Blies-Ebersing, FR;

Assignee:

Deere & Company, Moline, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring arrangement for spectroscopic examination and throughput acquisition of a crop flow is provided, the arrangement having a spectrometer which comprises a light source, a window, a dispersive element and a detector, the light source is positioned to illuminate the crop flow during operation through the window, and positioned such that light reflected by the crop flow passes through the window and onto the dispersive element, which is positioned to deflect the reflected light onto the detector in different directions as a function of wavelength, a throughput-determining device cooperating with the crop flow, and a recording device for recording the measured values of the spectrometer and of the throughput determining device.


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