The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2012

Filed:

Oct. 16, 2008
Applicant:

Shigeki Yoshida, Tokyo, JP;

Inventor:

Shigeki Yoshida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/18 (2010.01); G01Q 60/22 (2010.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe for near-field light scattering, has, on the tip thereof, at least fine particles containing silver or silver oxide, a titanium oxide layer, and a silver layer at least in the named order from the surface thereof. A process for producing the probe for near-field light scattering comprises at least steps of forming a silver layer, a titanium oxide layer, and fine particles containing silver or silver oxide in the named order on the body of the probe. A near-field optical microscope or a Raman spectroscope, comprises the probe for the near-field light scattering; a control function for bringing the probe into contact with a surface of a test sample; an optical excitation system for producing an exciting light to or vicinity of the tip of the probe; and detecting optical system for detecting detection light emitted form the tip of the probe.


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