The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2012

Filed:

May. 02, 2008
Applicants:

Seok-hyun Yun, Cambridge, MA (US);

Giuliano Scarcelli, Boston, MA (US);

Inventors:

Seok-Hyun Yun, Cambridge, MA (US);

Giuliano Scarcelli, Boston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Exemplary embodiments of methods, arrangements and systems for obtaining information about a sample can be provided. For example, in one exemplary embodiment, it is possible to receive a first electro-magnetic radiation from a sample which is based on a second electro-magnetic radiation forwarded to the sample. The first electro-magnetic radiation may have a first frequency and the second electro-magnetic radiation may have a second frequency which is different from the first frequency. The difference between the first and second frequencies can be based on an acoustic wave inside the sample related to at least one characteristic of the sample. Further, it is possible to receive at least a portion of the first electromagnetic radiation and separate it into a particular finite number (N) of frequency component radiations. In addition, it is possible to receive a particular energy of more than 1/N of energy of the third electro-magnetic radiation, and generate information associated with the sample. Certain exemplary embodiments of the present invention are capable of obtaining information associated with a sample, particularly its mechanical properties, non-contact using electromagnetic radiation.


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