The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2012
Filed:
Jan. 29, 2009
Ralf Netz, Jena, DE;
Wolfgang Bathe, Jena, DE;
Joerg Steinert, Jena, DE;
Werner Kleinschmidt, Adelebsen, DE;
Ingo Fahlbusch, Goettingen, DE;
Michael Brehm, Sulzbach-Laufen, DE;
Ralf Netz, Jena, DE;
Wolfgang Bathe, Jena, DE;
Joerg Steinert, Jena, DE;
Werner Kleinschmidt, Adelebsen, DE;
Ingo Fahlbusch, Goettingen, DE;
Michael Brehm, Sulzbach-Laufen, DE;
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.