The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2012
Filed:
Aug. 15, 2007
Alfred Böcking, Aachen, DE;
Dietrich Meyer-ebrecht, Aachen, DE;
Alfred Böcking, Aachen, DE;
Dietrich Meyer-Ebrecht, Aachen, DE;
Motic China Group Co. Ltd., Xiamen, CN;
Abstract
The invention describes a method for cell analysis in which the cells to be analyzed are adhesively applied to a slide and stained with a first stain. A first digital image is then taken and stored of the cells applied to the slide and stained. After the first digital image is taken, these same cells are treated with a second stain while on the same slide in such a way that their optically measurable properties change. A second digital image is then taken of the cells applied to the slide and stored. According to the invention, a group of preparations with cells to be analyzed is first stained with a stain of a highly sensitive analysis method, and only the preparations with positive findings are further processed.