The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2012

Filed:

May. 15, 2008
Applicants:

Thomas E. Drake, Jr., Fort Worth, TX (US);

Marc Dubois, Keller, TX (US);

Peter W. Lorraine, Niskayuna, NY (US);

John B. Deaton, Jr., Niskayuna, NY (US);

Robert Filkins, Niskayuna, NY (US);

Inventors:

Thomas E. Drake, Jr., Fort Worth, TX (US);

Marc Dubois, Keller, TX (US);

Peter W. Lorraine, Niskayuna, NY (US);

John B. Deaton, Jr., Niskayuna, NY (US);

Robert Filkins, Niskayuna, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 21/41 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mid infrared range laser source for ultrasound inspection having a high energy laser coupled with one or more harmonic generation devices. The high energy laser may be a COlaser and tuned to emit laser light at a single wavelength. The harmonic generation devices convert the laser beam into the mid infrared range for optimal ultrasound inspection.


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