The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2012
Filed:
Jan. 21, 2009
Applicants:
Scott Valoff, San Diego, CA (US);
Marcus Kramer, San Diego, CA (US);
Eric Gawehn, Mountain View, CA (US);
Inventors:
Scott Valoff, San Diego, CA (US);
Marcus Kramer, San Diego, CA (US);
Eric Gawehn, Mountain View, CA (US);
Assignee:
Cypress Semiconductor Corporation, San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01D 11/00 (2006.01); G12B 9/00 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A monitoring device assembly and method may include a primary interface for attaching to a monitored device, and a monitoring device mechanically coupled to the primary interface that captures an image of the monitored device.
Valoff, Scott. (2012). Monitoring devices, assemblies and methods for attachment to gauges and the like (U.S. Patent No. 8112897). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8112897
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile