The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Jan. 25, 2010
Wendy Ann Belluomini, San Jose, CA (US);
Binny Sher Gill, Shrewsbury, MA (US);
Xifeng Yan, Santa Barbara, CA (US);
Pin Zhou, San Jose, CA (US);
Wendy Ann Belluomini, San Jose, CA (US);
Binny Sher Gill, Shrewsbury, MA (US);
Xifeng Yan, Santa Barbara, CA (US);
Pin Zhou, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the invention relate to automated system problem diagnosing. An index is created with problem description information of previously diagnosed problems, a diagnosis for each problem, and a solution to each diagnosis. System states, traces and logs are extracted from a source system with a new problem. The problem diagnosis system generates problem description information of the new problem from the system states, traces and logs. Problem description information of the new problem is compared with problem description information in the problem description index. A search score is computed for each document in the problem description index. The search score is a measure of similarity between each document in the index and the description of the new problem. A matching score is assigned to each previously diagnosed problems based on the search score. The matching score is a measure of similarity between the new problem and each previously diagnosed problem. The system determines a diagnosis and solution of the new problem based on a diagnosis and solution of one of the previously diagnosed problems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile