The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
May. 06, 2011
Todd O. Dampier, Mountain View, CA (US);
Robert Todd Hunter, Iii, San Francisco, CA (US);
Todd O. Dampier, Mountain View, CA (US);
Robert Todd Hunter, III, San Francisco, CA (US);
Merced Systems, Inc., Redwood Shores, CA (US);
Abstract
A received report query specifies a dimension coordinate constraint and an associated grain for the dimension coordinate constraint. At least one query is generated to the dimensionally-modeled fact collection. A result of providing the at least one query to the dimensionally-modeled fact collection is processed. The processed result includes an indication of every dimension coordinate satisfying the dimension coordinate constraint and having a particular value at the associated grain, and the processed result further includes facts of the dimensionally-modeled fact collection that are specified by at least one other dimension coordinate indicated by the processed result having the particular value at the associated grain and not satisfying the dimension coordinate constraint.