The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8112378 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 07, 2012

Filed:

Jun. 17, 2008
Applicants:

Yutaka Kudo, San Jose, CA (US);

Tetsuya Masuishi, San Jose, CA (US);

Takahiro Fujita, San Jose, CA (US);

Tomohiro Morimura, Kanagawa-Ken, JP;

Inventors:

Yutaka Kudo, San Jose, CA (US);

Tetsuya Masuishi, San Jose, CA (US);

Takahiro Fujita, San Jose, CA (US);

Tomohiro Morimura, Kanagawa-Ken, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A root cause analysis engine uses event durations and gradual deletion of events to improve analysis accuracy and reduce the number of required calculations. Matching ratios of relevant rules are recalculated every time notification of an event is received. The calculation results are held in a rule memory in the analysis engine. Each event has a valid duration, and when the duration has expired, that event is deleted from the rule memory. Events held in the rule memory can be deleted without affecting other events held in the rule memory. The analysis engine can then re-calculate the matching ratio of each rule by only performing the re-calculation with respect to affected rules related to the deleted event. The calculation cost can be reduced because analysis engine processes events incrementally or decrementally. Analysis engine can determine the most possible conclusion even if one or more condition elements were not true.


Find Patent Forward Citations

Kudo, Yutaka. (2012). Methods and systems for performing root cause analysis (U.S. Patent No. 8112378). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8112378

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