The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2012

Filed:

Dec. 17, 2007
Applicant:

Shankar Subramaniam, Vernon, CT (US);

Inventor:

Shankar Subramaniam, Vernon, CT (US);

Assignee:

Concepts ETI, Inc., Wilder, VT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for automatically generating a computation mesh for use with an analytical tool, the computation mesh having a plurality of ξ-grid lines and η-grid lines intersecting at mesh points positioned with respect to an inner boundary and an outer boundary. The system and method includes receiving information corresponding to a shape to be analyzed, ξ-grid line mesh parameter value corresponding to a desired number of ξ-grid lines for the computation mesh, and an η-grid line mesh parameter value corresponding to a desired number of η-grid lines for the computation mesh, and generating the computation mesh from one or more mesh equations without the need for receiving additional information from a user. In one example, the solving of the one or more mesh equations includes an outer boundary distance parameter that is a function of an inner boundary distance parameter and one of a natural log of the η-grid line mesh parameter value and a square root of the η-grid line mesh parameter value.


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