The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Mar. 24, 2009
Joseph M. Gorin, Santa Rosa, CA (US);
Joseph M. Gorin, Santa Rosa, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method is provided for aligning a measurement instrument that includes a tunable filter. The method includes: (i) applying an output signal of an internal noise source of the measurement instrument to the input of the tunable filter, (ii) applying a control signal to the tunable filter to tune the tunable filter to a selected alignment frequency, (iii) measuring a value for a gain alignment parameter of the tunable filter while the output signal of the internal noise source is applied to the input of the tunable filter and the control signal is applied to the tunable filter, (iv) storing the measured gain alignment parameter value in an alignment table in the memory device, and (v) repeating steps (ii) through (iv) for a plurality of selected alignment frequencies in an operating frequency range of the tunable filter.