The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Apr. 29, 2009
Tian Chen, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
Xiaoming Du, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
James Allen Baird, Amelia, OH (US);
Xinjue Zou, Shanghai, CN;
Kevin William Meyer, Cincinnati, OH (US);
Tian Chen, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
Xiaoming Du, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
James Allen Baird, Amelia, OH (US);
Xinjue Zou, Shanghai, CN;
Kevin William Meyer, Cincinnati, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.