The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8112042 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 07, 2012

Filed:

Dec. 22, 2009
Applicants:

Yuji Ikeda, Saitama, JP;

Yasuhiko Hiehata, Saitama, JP;

Inventors:

Yuji Ikeda, Saitama, JP;

Yasuhiko Hiehata, Saitama, JP;

Assignee:

KDDI Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A wireless communication device is disclosed in which signal quality values C[t] of a wireless signal received by the wireless communication device is successively measured at variable time intervals Δt, mean value μ of the successively-measured signal quality values C[t] is calculated, standard deviation σ of the successively-measured signal quality values C[t] is calculated, a determination is made as to whether the signal quality value C[t] at present time satisfies a predetermined inequality which represents that a signal quality value C[t] at arbitrary time lies within k times the standard deviations σ away from the mean value μ, and lengths of the time intervals Δt for the measurement device are controlled based on the determination.


Find Patent Forward Citations

Ikeda, Yuji. (2012). Wireless communication device capable of measuring quality of wireless signal at variable time intervals (U.S. Patent No. 8112042). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8112042

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