The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Jul. 31, 2007
Jesse R. Boyer, Berlin, CT (US);
Jeffry K. Pearson, Newport Beach, CA (US);
Benjamin W. Meissner, San Antonio, TX (US);
Randall W. Joyner, Union, CT (US);
James Romanelli, Colchester, CT (US);
Jesse R. Boyer, Berlin, CT (US);
Jeffry K. Pearson, Newport Beach, CA (US);
Benjamin W. Meissner, San Antonio, TX (US);
Randall W. Joyner, Union, CT (US);
James Romanelli, Colchester, CT (US);
United Technologies Corporation, Hartford, CT (US);
Abstract
A method for inspecting geometrical shapes of objects to determine selected dimensions thereof based on data characterizing such objects obtained through stereoscopic photographs taken by a pair of cameras with fields of view intersecting to thereby provide a photographic event measurement volume that includes at least a portion of each of such objects being photographed. The method involves using previously specified procedures to check on the cameras performance consistency in photographing from different positions, preparing the object to be inspected including providing reference point targets thereon, scanning that object with the cameras from different camera pair positions, processing the resulting data to represent the scan basis geometrical shape of the object, and orient it to compare with the dimensional specifications therefor.